Practical limits of error correction for quantum metrology

Abstract Noise is the greatest obstacle in quantum metrology that limits it achievable precision and sensitivity. There are many techniques to mitigate effect of noise, but this can never be done completely. One commonly proposed technique repeatedly apply error correction. Unfortunately, required repetition frequency needed recover Heisenberg limit unachievable with existing technologies. In article we explore discrete application correction current technological limitations mind. We establish beneficial highlight factors which need improved so one reliably reach level precision.